NANOSENSORS™launches new Silicon Plateau Tip Series

NANOSENSORS™ has launched a new series of silicon Plateau Tips today.

Plateu-tipThe Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

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NANOSENSORS™ introduces next generation XY-Alignment AFM probe – easy tip exchange without laser repositioning

NANOSENSORS™ today introduced its new PointProbe® Plus XY-Alignment series.

The invention of the Alignment Chip by NANOSENSORS™ more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.

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NANOSENSORS™ launches new Silicon MFM Probe Series

NANOSENSORS™ has launched a new Silicon MFM Probe Series today.

For visualisation of magnetic domains by scanning probe microscopy different magnetic force microscopy probes are necessary.

NANOSENSORS™ Silicon MFM Probes are based on the well-known PointProbe® Plus AFM probe. The probes are optimized in view of high sensitivity and enable Tapping Mode, Non-contact and lift mode operation in air. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes show an excellent long-term stability.

The NANOSENSORS™ Silicon MFM Probe Series offers six different types of MFM Probes:

1. PPP-MFMR – Standard Magnetic Force Microscopy Probe

This standard probe for magnetic force microscopy provides a good sensitivity, resolution and coercitivity. The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution.

Stable imaging of a variety of samples such as different recording media has been demonstrated with this probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 300 Oe
Magnetisation: 300 emu/cm³
Magnetic Tip Moment: ~ 10^13 emu
Guaranteed Tip Radius: < 50 nm
Achievable Lateral Resolution: < 50 nm

 

2. PPP-LM-MFMR – Low Momentum Magnetic Force Microscopy Probe This AFM probe is designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution compared to the standard PPP-MFMR probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 250 Oe
Magnetisation: 150 emu/cm³
Magnetic Tip Moment: x0.5
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

3. PPP-LC-MFMR – Low Coercivity Magnetic Force Microscopy Probe

This AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

4. SSS-MFMRSuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe

This MFM probe was especially designed for high resolution magnetic imaging. The well-known NANOSENSORS™ SuperSharpSilicon™ tip is used as a basis and is combined with a very thin hard magnetic coating. This results in an extremely small tip radius and a high aspect ratio on the last few hundred nanometers of the tip apex – the essential requirements for high lateral resolution down to 20 nm in ambient conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm

 

5. SSS-QMFMR – SuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe with a high Q-factor

This special version of the high resolution magnetic force microscopy probe was especially tailored for applications in UHV. The high resolution and the magnetic characteristics are identical to the properties of the SSS-MFMR. Additionally it achieves a typical Q-factor of over 35 000 under UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm
UHV Quality Factor: > 30 000

 

6. PPP-QLC-MFMR – Low Coercivity Magnetic Force Microscopy Probe with a high Q-factor – for applications in UHV

Like the PPP-LC-MFMR this AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Additionally it offers a Q-factor typically higher than 35 000 und UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm
UHV Quality Factor: > 30 000

 

For further information please refer to the MFM Probe Series flyer.