High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM  probes developed and manufactured by our colleague Christoph Richter.

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The graph is showing feedback mode SECM-AFM images of gold patterned silicon oxide substrate immersed in 1 mM FcMeOH/0.1 M KNO3. (a) Topographical scan acquired in contact mode and (b) electrochemical scan recorded at a lift height of 150 nm. http://pubs.acs.org/doi/abs/10.1021/ac500946v

Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf

Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”,  Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.