NANOSENSORS™ AdvancedTEC™ Silicon-SPM-probes for Contact Mode, Non-Contact and Force Modulation Mode are now available

We would like to thank our customers for their overwhelming interest in this new product and for their enthusiastic feedback.

The AdvancedTEC™ probe will be available in the following types and package sizes:

  • AdvancedTEC 3D View
    AdvancedTEC 3D View
    AdvancedTEC Front View
    AdvancedTEC Front View
    AdvancedTEC 3D Side View
    AdvancedTEC 3D Side View

    AdvancedTEC NC for Non-Contact Mode/Tapping Mode™
    available from December 1st, 2003:

    Typical Values:

    Force Constant = 45 N/m, Resonance Frequency = 335 kHz,
    cantilever length = 160 µm, cantilever width = 45 µm

    Packages of 10, 20, 50, 100 and 200 sensors.

  • AdvancedTEC NC for Non-Contact Mode/Tapping Mode™
    available from December 1st, 2003:Typical Values:

    Force Constant = 45 N/m, Resonance Frequency = 335 kHz,
    cantilever length = 160 µm, cantilever width = 45 µm

    Packages of 10, 20, 50, 100 and 200 sensors.

  • AdvancedTEC FM for force modulation mode,available from December 1st, 2003:Typical Values:

    Force Constant = 2.8 N/m, Resonance Frequency = 85 kHz,
    cantilever length = 240 µm, cantilever width = 35 µm

    Packages of 10, 20, 50, 100 and 200 sensors.

NANOSENSORS™ Introduces the Next Generation of AFM Probes

NANOSENSORS™ today introduced a revolutionary new probe type for Atomic Force Microscopy – the AdvancedTEC™.

 AdvancedTEC-3D-ViewThis highly doped monolithic silicon sensor is designed for precise positioning and high resolution imaging. It features a rectangular cantilever with a triangular free end and a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only scanning probe in the world that offers REAL TIP VISIBILITY through the optical system of the Atomic Force Microscope – even when the probe is slightly tilted due to its mounting. This makes it the premium choice for all applications where the tip has to be visible (e.g. nanomanipulation). The AdvancedTEC™ Tip is defined by real crystal planes which results in highly reproducible geometries and extremely smooth surfaces. Due to its very small half cone angles this new tip also shows great performance on samples that have a small pattern size combined with steep side walls.

Different probe versions for common application modes like contact, non-contact or tapping as well as force modulation mode imaging will be available by November 2003.

For further information please refer to the ATEC product-information or contact info@nanosensors.com.

AdvancedTEC™ is an acronym for Advanced Tip at the End of the Cantilever

Nanosensors™ appoints new European Distributor

Nanosensors™ announced that its longstanding successful business partnership with L.O.T. Oriel GmbH as its European distributor will terminate May 4th, 2003.

As of May 5th, 2003

NanoAndMore GmbH
Merckstrasse 22
64283 Darmstadt
Germany

Phone: +49 6151 39 66 777
Fax: +49 6151 39 66 778
burshille@nanoandmore.com
www.nanoandmore.com

will be the official commercial agent for Nanosensors™ in Europe.

Mr. Peer Burshille, director of NanoAndMore GmbH, has more than ten years experience in the SPM probe market. He and his team will do all in their power to satisfy the needs of Nanosensors™ customers.

Nanosensors™ is convinced that this new collaboration will develop to the mutual benefit of its customers and the Nanosensors™ brand and therefore kindly asks its customers to transfer their confidence to its new business partner.