NANOSENSORS™ Q30K-Plus Silicon AFM probes for Non-Contact Mode and Force Modulation Mode are now available

The new NANOSENSORS™ Q30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications is now available.

Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

We would like to thank all customers who have tested samples of this probe for their feedback.

NANOSENSORS™ appoints NanoAndMore USA Corp. as its distributor for USA, Canada and Mexico

NANOSENSORS™ has appointed NanoAndMore USA Corp. (NAM) as the official distributor of its line of probes for Atomic Force Microscopes (AFM) and Scanning Probe Microscopes (SPM) in the USA, Canada and Mexico (NAFTA).

NAM-20130814050850Being a part of the NanoWorld Group, and with the industry expertise of Mr. McMurtry, will enable NanoAndMore USA to react quickly to the steady increase in use and the changing requirements of the growing community of AFM users. This, in conjunction with holding the largest stock of NANOSENSORS™ products in the USA, puts NanoAndMore USA in a unique position.

NAM is the first distributor of AFM probes to sell them in premounted formats for the more widely used AFM systems that require them, as well as just the probes themselves. This allows the end user to have a second source (or primary source) of necessary premounted tips.

NanoAndMore USA Inc.
9 James F. Byrnes Street
Lady’s Island, SC 29907
USA

email: usa@nanoandmore.com
Phone.: + 1 843-521-1108
+ 1 843-521-1108
Fax: + 1 843-521-1148
www.nanoandmore.com

NANOSENSORS™ announces new high-Q AFM probe

NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and an enhanced signal to noise ratio for UHV applications.

q300k-afmprobeBased on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the following versions:
PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.