All posts by NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

Nanotechnology conference in Japan – Welcome at nano tech 2017

Full house at the NANOSENSORS™ booth 4s-27 at the nano tech 2017, Tokyo, Japan
Full house at the NANOSENSORS™ booth 4s-27 at the nano tech 2017, Tokyo, Japan

The year starts well! Full house at the nano tech 2017, the international Nanotechnology conference and exhipition held at Big Sight Tokyo (Feb 15-17, 2017). Welcome! We are at booth 4s-27 of our distributor in Japan, Toyo Corporation.

NANOSENSORS™ at the nano tech 2017 international nanotechnology conference and exhibition, Big Sight Tokyo, Japan
NANOSENSORS™ at the nano tech 2017 international nanotechnology conference and exhibition, Big Sight Tokyo, Japan

PointProbe Plus XL – Extra Tall Tips for Nanoprofiling

Are you looking for extra tall tips for nanoprofiling and other applications in this direction? Then look no further. There is a PointProbe Plus version with a tip height of 50µm. On the NANOSENSORS Special Developments List http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf  on page 7 you will find three types of cantilevers (one for non-contact mode, one for force modulation mode and one for contact mode).

NANOSENSORS extra tall PointProbe Plus AFM tip - tip height 50µm - typical tip radius 10nm
NANOSENSORS extra tall PointProbe Plus AFM tip – tip height 50µm