High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM  probes developed and manufactured by our colleague Christoph Richter.

ec-paper_richter03

The graph is showing feedback mode SECM-AFM images of gold patterned silicon oxide substrate immersed in 1 mM FcMeOH/0.1 M KNO3. (a) Topographical scan acquired in contact mode and (b) electrochemical scan recorded at a lift height of 150 nm. http://pubs.acs.org/doi/abs/10.1021/ac500946v

Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf

Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”,  Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.

Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)

Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese.

NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required. Platinum Silicide AFM tips are made of highly conductive platinum silicide which unites high conductivity (higher than conductive diamond coating and as good as metal coated tips) with a high wear resistance (much higher than metal coated probes and almost as good as diamond coated probes). Additionally the new PtSi probes have a slightly decreased tip radius compared to standard metal coated AFM probes. They can be used for any kind of electric or electrostatic AFM measurement, except SSRM.

– Hard, solid and conductive silicide apex
– Smaller tip radius (nominal 25nm) than normal metal coated probes (nominal 30nm). About five to six times smaller radius when – compared to diamond coated tips (nominal 150nm)
– Almost metal like conductivity.
– high wear resistance compared to silicon and PtIr coated tips

NANOSENSORS™ Platinum Silicide probes are ideally suited for
– Conductive AFM (CAFM)
– Tunneling AFM (TUNA)
– Scanning Capacitance Microscopy (SCM)
– Kelvin Probe Force Microscopy (KPFM)
– Electrostatic Force Microscopy (EFM)