High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory got impressive Scanning Electrochemical AFM measurement results captured with EC-AFM  probes developed and manufactured by our colleague Christoph Richter.

ECpaper_fig01

http://pubs.acs.org/doi/abs/10.1021/ac500946v

Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf

Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”,  Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.

Visit our distributor NanoAndMore USA at booth no. 469 at Biophys

Learn more about the NANOSENSORS uniqprobes for biology and life science applications at the NanoAndMore booth no. 469 at the Biophysics Meeting in Baltimore this week. #bps15

NANOSENSORS uniqprobe - reduced thermal drift for biology and life-science applications
NANOSENSORS uniqprobe – reduced thermal drift for biology and life-science applications

 

Calibration service for AFM Cantilever

NANOSENSORS™ screencast on the service for Calibration for AFM Cantilevers, presented by Wolfgang Engl.

Accurately determined cantilever properties are very important for quantitative force measurements. Force constant and resonance frequency are determined either by thermal tune, the Sader- or the dimensional method, respectively. Usually, the thermal tune method delivers the most precise values, but suffers from the fact that the AFM tip has to get in contact to the urface to calibrate the photo-detector sensitivity. This procedure may damage or break the tip!

NANOSENSORS™ offers a thermal tune calibration procedure performed by Laser vibrometry. This method is contact free and therefore does no damage the tip, but preserves the original AFM tip quality. To ensure the highest level of accuracy NANOSENSORS™ cantilever calibration method is calibrated with a standard, certified by the national German metrology institute.

This service is part of our Special Development List
http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf
More information at info@nanosensors.com