NANOSENSORS™ launches new Silicon MFM Probe Series

NANOSENSORS™ has launched a new Silicon MFM Probe Series today.

For visualisation of magnetic domains by scanning probe microscopy different magnetic force microscopy probes are necessary.

NANOSENSORS™ Silicon MFM Probes are based on the well-known PointProbe® Plus AFM probe. The probes are optimized in view of high sensitivity and enable Tapping Mode, Non-contact and lift mode operation in air. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes show an excellent long-term stability.

The NANOSENSORS™ Silicon MFM Probe Series offers six different types of MFM Probes:

1. PPP-MFMR – Standard Magnetic Force Microscopy Probe

This standard probe for magnetic force microscopy provides a good sensitivity, resolution and coercitivity. The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution.

Stable imaging of a variety of samples such as different recording media has been demonstrated with this probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 300 Oe
Magnetisation: 300 emu/cm³
Magnetic Tip Moment: ~ 10^13 emu
Guaranteed Tip Radius: < 50 nm
Achievable Lateral Resolution: < 50 nm

 

2. PPP-LM-MFMR – Low Momentum Magnetic Force Microscopy Probe This AFM probe is designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution compared to the standard PPP-MFMR probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 250 Oe
Magnetisation: 150 emu/cm³
Magnetic Tip Moment: x0.5
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

3. PPP-LC-MFMR – Low Coercivity Magnetic Force Microscopy Probe

This AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

4. SSS-MFMRSuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe

This MFM probe was especially designed for high resolution magnetic imaging. The well-known NANOSENSORS™ SuperSharpSilicon™ tip is used as a basis and is combined with a very thin hard magnetic coating. This results in an extremely small tip radius and a high aspect ratio on the last few hundred nanometers of the tip apex – the essential requirements for high lateral resolution down to 20 nm in ambient conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm

 

5. SSS-QMFMR – SuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe with a high Q-factor

This special version of the high resolution magnetic force microscopy probe was especially tailored for applications in UHV. The high resolution and the magnetic characteristics are identical to the properties of the SSS-MFMR. Additionally it achieves a typical Q-factor of over 35 000 under UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm
UHV Quality Factor: > 30 000

 

6. PPP-QLC-MFMR – Low Coercivity Magnetic Force Microscopy Probe with a high Q-factor – for applications in UHV

Like the PPP-LC-MFMR this AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Additionally it offers a Q-factor typically higher than 35 000 und UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm
UHV Quality Factor: > 30 000

 

For further information please refer to the MFM Probe Series flyer.

NanoWorld AG appoints new Key Account Manager

NanoWorld AG is proud to announce that it has been able to secure the services of Dr. Terunobu Akiyama as Key Account Manager A-Probe. Dr. Akiyama is the inventor of this new self-sensing and self-actuating tuning fork probe.

This product has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The novel product is called the Akiyama-probe or A-probe to honour its inventor. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.

It features a symmetrical arrangement of a U-shaped silicon cantilever attached to the two prongs of a quartz tuning fork. The tuning fork serves as an oscillatory force sensor that governs the tip vibration frequency as well as the amplitude and ensures a high mechanical Q-factor. The force constant of the probe is determined by the cantilever and can be adjusted independently from the resonance frequency.

Dr. Akiyama serves as key account manager for the market introduction of this innovative product. In his capacity as key account manager A-probe Dr. Akiyama will be in charge of communication and cooperation with all AFM manufacturers who are working on the development of a scanning probe microscope using this novel probe concept as well as being responsible for the further development of this new product.

He received his Ph.D. degree in electrical and electronic engineering from Sophia University, Tokyo, Japan. During his time at the Institute of Industrial Science at the University of Tokyo, Japan, Dr. Akiyama received a Post-Doctoral Fellowship for Young Scientists from the Japanese Society for the Promotion of Science. Since 1995 Dr. Akiyama is conducting his research at the IMT at the University of Neuchâtel, Switzerland.

During his scientific career Dr. Akiyama has published a variety of papers in renowned international journals in the field of Scanning Probe Microscopy. His research interests include microactuators, microsensors and microsystems. The Scratch Drive Actuator (SDA), one of the well-known standard electrostatic actuators based on MEMS technology, is also one of his inventions.

While Dr. Akiyama will maintain his position at the IMT and continue his research there he will devote 50% of his time to the market introduction of his invention, the self-sensing and -actuating tuning fork probe called A-probe in the future.