NANOSENSORS™ announces the new PointProbe® Plus AFM Probe

Improved Consistency and Resolution through an advanced Tip Manufacturing Process

TEM image of the PointProbe® Plus tip apex
TEM image of the PointProbe® Plus tip apex

Neuchatel, August 1st, 2004 – NANOSENSORS™ today announced its new product series, the PointProbe® Plus.

The new PointProbe® Plus (PPP) AFM probe combines the well-known features of the proven PointProbe® Series such as high application versatility and compatibility with most commercial AFMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For further information please refer to the PointProbe® Plus product flyer.