For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||5||4.0 - 6.0|
|Mean Width /µm||33||30 - 45|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||15||5 - 37|
|Resonance Frequency /kHz||130||96 - 175|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|SSS-SEIHR-10||10||of all probes||reflex|
|SSS-SEIHR-20||20||of all probes||reflex|
|SSS-SEIHR-W||>370||of up to 32 probes||reflex|
Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
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