NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
|Property||Nominal Value||Specified Range|
|Thickness /µm||7||6.0 - 8.0|
|Mean Width /µm||38||30 - 45|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||48||21 - 98|
|Resonance Frequency /kHz||190||146 - 196|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|SSS-NCL-10||10||of all probes||none|
|SSS-NCL-20||20||of all probes||none|
|SSS-NCL-W||>370||of up to 32 probes||none|
Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
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