How To Buy

SSS-NCL

SuperSharpSilicon™ - Non-Contact / Tapping Mode - Long Cantilever

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 196

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
SSS-NCL-10 10 of all probes none
SSS-NCL-20 20 of all probes none
SSS-NCL-50 50 without none
SSS-NCL-W >370 of up to 32 probes none


Product screencast NANOSENSORS SuperSharpSilicon

Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.

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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG