SSS-SEIHR

SuperSharpSilicon™ - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:: - guaranteed tip radius of curvature < 5 nm; - typical tip radius of curvature of 2 nm; - typical aspect ratio at 200 nm from tip apex in the order of 4:1; - half cone angle at 200 nm from apex < 10°; - highly doped to dissipate static charge; - high mechanical Q-factor for high sensitivity; - alignment grooves on backside of silicon holder chip; - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip; - compatible with PointProbe^® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:

Technical Data	Nominal Value	Specified Range
Thickness /µm	5	4.0 - 6.0
Width /µm	33	30 - 45
Length /µm	225	215 - 235
Force Constant /(N/m)	15	5 - 37
Resonance Frequency /kHz	130	96 - 175

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Coating
SSS-SEIHR-10	10	of all probes	reflex
SSS-SEIHR-20	20	of all probes	reflex
SSS-SEIHR-50	50	without	reflex
SSS-SEIHR-W	> 370	of up to 32 probes	reflex

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com