SSS-SEIH

SuperSharpSilicon™ - SEIKO microscopes - Non-Contact / Tapping Mode - High Force Constant

The probe offers unique features:

- guaranteed tip radius of curvature < 5 nm

- typical tip radius of curvature of 2 nm

- typical aspect ratio at 200 nm from tip apex in the order of 3:1

- half cone angle at 200 nm from apex < 10°

- monolithic material

- highly doped to dissipate static charge

- chemically inert

- high mechanical Q-factor for high sensitivity

- alignment grooves on backside of silicon holder chip

- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
  of the alignment chip

- compatible with PointProbe^® Plus XY-Alignment Series

Cantilever data:

Technical Data Nominal Value Specified Range Thickness /µm 5 4.0 - 6.0 Width /µm 33 30 - 45 Length /µm 225 215 - 235 Force Constant /(N/m) 15 5 - 37 Resonance Frequency /kHz 130 96 - 175