The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).
|Property||Nominal Value||Specified Range|
|Thickness /µm||5||4.0 - 6.0|
|Mean Width /µm||33||25 - 40|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||15||5 - 37|
|Resonance Frequency /kHz||130||96 - 175|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-SEIH-10||10||of all probes||none|
|PPP-SEIH-20||20||of all probes||none|
|PPP-SEIH-W||> 380||of up to 32 probes||none|