The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||5||4.0 - 6.0|
|Mean Width /µm||33||25 - 40|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||15||5 - 37|
|Resonance Frequency /kHz||130||96 - 175|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-SEIHR-10||10||of all probes||reflex|
|PPP-SEIHR-20||20||of all probes||reflex|
|PPP-SEIHR-W||> 380||of up to 32 probes||reflex|