The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||4||3.0 - 5.0|
|Mean Width /µm||30||22.5 - 37.5|
|Length /µm||125||115 - 135|
|Force Constant /(N/m)||42||10 - 130|
|Resonance Frequency /kHz||330||204 - 497|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-RT-NCHR-10||10||of all probes||reflex|
|PPP-RT-NCHR-20||20||of all probes||reflex|