The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||4||3.0 - 5.0|
|Mean Width /µm||30||22.5 - 37.5|
|Length /µm||125||115 - 135|
|Force Constant /(N/m)||42||10 - 130|
|Resonance Frequency /kHz||330||204 - 497|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-NCHAuD-10||10||of all probes||Au (detector side)|