The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
|Property||Nominal Value||Specified Range|
|Thickness /µm||2||1.0 - 3.0|
|Mean Width /µm||50||42.5 - 57.5|
|Length /µm||450||440 - 460|
|Force Constant /(N/m)||0.2||0.02 - 0.77|
|Resonance Frequency /kHz||13||6 - 21|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-CONT-10||10||of all probes||none|
|PPP-CONT-20||20||of all probes||none|
|PPP-CONT-W||> 380||of up to 32 probes||none|