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PtSi-NCH

Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM and Scanning Capacitance Microscopy (SCM).

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PtSi-NCH-10 10 of all probes PtSi (reflective)
PtSi-NCH-20 20 of all probes PtSi (reflective)
PtSi-NCH-50 50 without PtSi (reflective)


Product Screencast NANOSENSORS™ Platinum Silicide AFM Probes

Please watch the new product screencast on the NANOSENSORS™ Platinum Silicide AFM Probes at http://youtu.be/watch?v=w0Tjg08ai-I.
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG