NANOSENSORS™

PPP-ZEILR

PointProbe® Plus ZEISS Veritekt Microscopes - Contact Mode Low Force Constant - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.
PPP-ZEILR Front View  PPP-ZEILR Closeup Front View
Cantilever data:
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 55 47.5 - 62.5
Length /µm 450 440 - 460
Force Constant /(N/m) 1.6 0.6 - 3.9
Resonance Frequency /kHz 27 19 - 35
Order codes and shipping units:
Order Code Quantity Data Sheet Coating
PPP-ZEILR-10 10 of all probes reflex
PPP-ZEILR-20 20 of all probes reflex
PPP-ZEILR-50 50 without reflex
PPP-ZEILR-W > 380 of up to 32 probes reflex
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com