The new
XY-auto alignment probes for
Non-
Contact / Tapping mode application (
High resonance frequency) extend the well-known plug-and-fit auto alignment concept of the
Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / Tapping mode applications. If the alignment chip is mounted to the AFM head probe exchange is possible with a tip repositioning accuracy of better than ± 8 µm.
As a matter of course, the features of the proven
Point
Probe
® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For further information please contact your local distributor or
NANOSENSORS™ directly.
NANOSENSORS™
is a trademark of NanoWorld AG / info@nanosensors.com /
www.nanosensors.com