PPP-XYCONTR
PointProbe® Plus XY-alignment Contact Mode Reflex Coating
The new XY-autoalignment probes for Contact mode application extend the well-known plug-and-fit autoalignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. If the alignment chip is mounted to the AFM head probe exchange is possible with a tip repositioning accuracy of better than ± 8 µm.
As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
- The probe offers unique features:
- - guaranteed tip radius of curvature < 10 nm
- - highly doped to dissipate static charge
- - Al coating on detector side of cantilever
- - chemically inert
- - high mechanical Q-factor for high sensitivity
- - tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
Cantilever data:
| Technical Data | Nominal Value | Specified Range |
|---|---|---|
| Thickness /µm | 2 | 1.0 - 3.0 |
| Mean Width /µm | 50 | 42.5 - 57.5 |
| Length /µm | 450 | 440 - 460 |
| Force Constant /(N/m) | 0.2 | 0.02 - 0.77 |
| Resonance Frequency /kHz | 13 | 6 - 21 |
Order codes and shipping units:
| Order Code | Quantity | Data Sheet | Coating |
|---|---|---|---|
| PPP-XYCONTR-10 | 10 | of all probes | reflex |
| PPP-XYCONTR-20 | 20 | of all probes | reflex |
| PPP-XYCONTR-50 | 50 | without | reflex |
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com