NANOSENSORS™

PPP-FM

PointProbe® Plus Force Modulation Mode

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM tip serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- alignment grooves on backside of silicon holder chip
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
  of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
PPP-FM Front View  PPP-FM Closeup Front View
Cantilever data:
Technical Data Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 30 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
Order codes and shipping units:
Order Code Quantity Data Sheet Coating
PPP-FM-10 10 of all probes without
PPP-FM-20 20 of all probes without
PPP-FM-50 50 without without
PPP-FM-W 385 of up to 32 probes without
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORSis a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com