NANOSENSORS™

PPP-CONT

PointProbe® Plus Contact Mode

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORSPPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
PPP-CONT Front View  PPP-CONT Closeup Front View
Cantilever data:
Technical Data Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.2 0.02 - 0.77
Resonance Frequency /kHz 13 6 - 21
Order codes and shipping units:
Order Code Quantity Data Sheet Coating
PPP-CONT-10 10 of all probes without
PPP-CONT-20 20 of all probes without
PPP-CONT-50 50 without without
PPP-CONT-W > 380 of up to 32 probes without
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORSis a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com