PL2-NCH

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:: - plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity

Cantilever data:

Technical Data	Nominal Value	Specified Range
Thickness /µm	4	3.0 - 5.0
Mean Width /µm	30	22.5 - 37.5
Length /µm	125	115 - 135
Force Constant /(N/m)	42	10 - 130
Resonance Frequency /kHz	330	204 - 497

Technical Data Tip	Value
*Plateau diameter () /µm**	1.8±0.5
Plateau rod height /µm	>2.0
Plateau edge radius /µm	0.2-0.4
Tip height (overall) /µm	10-15

* measured at a distance of 100nm from the end-face

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Coating
PL2-NCH-10	10	of all probes	without

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com