KIT
Evaluation Kits
For the evaluation of different sensor types we have assembled two special kits containing a broad selection of all available types. As a result these kits enable the application of new measurement modes and techniques without the necessity of buying large amounts of each of the required sensor types.
Evaluation Kit-1
Kit 1 consists of 22 AFM probes for Non-Contact / TappingMode with high frequencies, contact mode sensors and probes for force modulation mode all of them with and without reflex coating. This selection is rounded off by two AFM tips for magnetic force microscopy.
Kit 1 consists of 22 AFM probes for Non-Contact / TappingMode with high frequencies, contact mode sensors and probes for force modulation mode all of them with and without reflex coating. This selection is rounded off by two AFM tips for magnetic force microscopy.
| Quantity | Type | Short description, Application, Features |
|---|---|---|
| 4 | PPP-NCH | PointProbe® Plus silicon cantilevers for Non-Contact / Tapping Mode AFM (high frequency); force constant typ. 42 N/m, resonance frequency typ. 330 kHz |
| 4 | PPP-NCH | ditto, with reflex coating on the detector side of the cantilever |
| 2 | PPP-CONT | PointProbe® Plus silicon cantilevers for contact-mode AFM; force constant typ. 0.2 N/m, resonance frequency typ. 13 kHz |
| 2 | PPP-CONTR | ditto, with reflex coating on the detector side of the cantilever |
| 2 | PPP-MFMR | PointProbe® Plus silicon cantilevers for magnetic force microscopy; force constant typ. 2.8 N/m, resonance frequency typ. 75 kHz with hard magnetic coating on the tipside and reflex coating on the detector side of the cantilever |
| 4 | PPP-FM | PointProbe® Plus silicon cantilevers for force modulation mode; force constant typ. 2.8 N/m, resonance frequency typ. 75 kHz |
| 4 | PPP-FMR | ditto, with reflex coating on the detector side of the cantilever |
Evaluation Kit 2
Kit 2 consists of 19 AFM probes for Non-Contact / Tapping Mode with low frequencies, contact mode probes and cantilevers for lateral force microscopy all of them with and without reflex coating. This selection is rounded off by two AFM tips for electrostatic force microscopy.
Kit 2 consists of 19 AFM probes for Non-Contact / Tapping Mode with low frequencies, contact mode probes and cantilevers for lateral force microscopy all of them with and without reflex coating. This selection is rounded off by two AFM tips for electrostatic force microscopy.
| Quantity | Type | Short description, Application, Features |
|---|---|---|
| 4 | PPP-NCL | PointProbe® Plus silicon cantilevers for Non-Contact / Tapping Mode AFM (low frequency); force constant typ. 48 N/m, resonance frequency typ. 190 kHz |
| 4 | PPP-NCLR | ditto, with reflex coating on the detector side of the cantilever |
| 3 | PPP-CONT | PointProbe® Plus silicon cantilevers for contact-mode AFM; force constant typ. 0.2 N/m, resonance frequency typ. 13 kHz |
| 2 | PPP-CONTR | ditto, with reflex coating on the detector side of the cantilever |
| 2 | PPP-EFM | PointProbe® Plus silicon cantilevers for electrostatic force microscopy; force constant typ. 2.8 N/m, resonance frequency typ. 75 kHz with PtIr5 coating on both sides of the cantilever |
| 2 | PPP-LFM | PointProbe® Plus silicon cantilevers for lateral / friction force microscopy; force constant typ. 0.2 N/m, resonance frequency typ. 23 kHz |
| 2 | PPP-LFMR | ditto, with reflex coating on the detector side of the cantilever |
Order codes and shipping units:
| Order Code | Quantity | Data Sheet |
|---|---|---|
| KIT-1 | 22 | n/a |
| KIT-2 | 19 | n/a |
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com