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AR5T-NCH

High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ AR5T-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

On the model AR5T the last 2 µm of the tip are tilted 13° to the center axis of the cantilever. With this feature the tilt angle of the cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
AR5T-NCH-10 10 of all probes none
AR5T-NCH-20 20 of all probes none
AR5T-NCH-50 50 without none
AR5T-NCH-W > 370 of all probes none


Product Screencast NANOSENSORS™ High Aspect Ratio Silicon AFM probes

Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG