NANOSENSORS™ AR5-NCL AFM tips are designed for non-contact or tapping mode AFM. The NCL probe is designed for SPM systems requiring a minimum cantilever length > 125 µm or a resonance frequency of less than 400 kHz. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This cantilever type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Forced Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
|Property||Nominal Value||Specified Range|
|Thickness /µm||7||6.0 - 8.0|
|Mean Width /µm||38||30 - 45|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||48||21 - 98|
|Resonance Frequency /kHz||190||146 - 236|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|AR5-NCL-10||10||of all probes||none|
|AR5-NCL-20||20||of all probes||none|
|AR5-NCL-W||> 370||of all probes||none|
Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
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