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AR5-NCLR

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

NANOSENSORS™ AR5-NCLR AFM tips are designed for non-contact or tapping mode AFM. The NCL probe is designed for SPM systems requiring a minimum cantilever length > 125 µm or a resonance frequency of less than 400 kHz. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This cantilever type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
AR5-NCLR-10 10 of all probes reflex
AR5-NCLR-20 20 of all probes reflex
AR5-NCLR-50 50 without reflex
AR5-NCLR-W > 370 of all probes reflex


Product Screencast NANOSENSORS™ High Aspect Ratio Silicon AFM probes

AR5-NCLR


For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG