NANOSENSORS™ AR5-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
|Property||Nominal Value||Specified Range|
|Thickness /µm||4||3.0 - 5.0|
|Mean Width /µm||30||30 - 45|
|Length /µm||125||115 - 135|
|Force Constant /(N/m)||42||10 - 130|
|Resonance Frequency /kHz||330||204 - 497|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|AR5-NCH-10||10||of all probes||none|
|AR5-NCH-20||20||of all probes||none|
|AR5-NCH-W||> 370||of all probes||none|
Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
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