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AR5-NCHR

High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

NANOSENSORS™ AR5-NCHR AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips ar FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

The reflex coating is 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 330 204 - 497
Force Constant /(N/m) 42 10 - 130
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
AR5-NCHR-10 10 of all probes reflex
AR5-NCHR-20 20 of all probes reflex
AR5-NCHR-50 50 without reflex
AR5-NCHR-W > 370 of all probes reflex


Product Screencast NANOSENSORS™ High Aspect Ratio Silicon AFM probes

Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG