NANOSENSORS™ AR10-NCHR AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||4||3.0 - 5.0|
|Mean Width /µm||30||22.5 - 37.5|
|Length /µm||125||115 - 135|
|Force Constant /(N/m)||42||10 - 130|
|Resonance Frequency /kHz||330||204 - 497|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|AR10-NCHR-10||10||of all probes||reflex|
|AR10-NCHR-20||20||of all probes||reflex|
|AR10-NCHR-W||> 370||of all probes||reflex|
Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
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