FLAT

Flatness standard

The flatness standard consists of a superflat plane and is intended to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer.

A calibration certificate of PTB (Physikalisch Technische Bundesanstalt) is available on request for this model. Please ask for delivery time and prices.

Features:: - maximum peak to valley (p-v) distance of 10 nm on a 100 by 100 µm² area; - FindMe pattern for easy localisation of active area; - available with certificate

Dimensions
Chip size	5 x 7 mm²
Thickness of the chip	approx. 2.3 mm
Active area	200 x 200 µm²
FindMe structure	1200 x 1200 µm²

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Calibration Certificate
FLAT	1	enclosed	n/a
FLAT-CERT	1	enclosed	of PTB included

Please download the datasheet (PDF) for further information.

For further information please contact your local distributor or NANOSENSORS™ directly.
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