NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||2||1.0 - 3.0|
|Mean Width /µm||50||42.5 - 57.5|
|Length /µm||450||440 - 460|
|Force Constant /(N/m)||0.5||0.1 - 1.7|
|Resonance Frequency /kHz||20||11 - 29|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|CDT-CONTR-10||10||of all probes||diamond and reflex|
|CDT-CONTR-20||20||of all probes||diamond and reflex|
|CDT-CONTR-50||50||without||diamond and reflex|
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.