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CDT-CONTR

Conductive Diamond Coated Tip - Contact Mode - Reflex Coating

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The probe offers unique features:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
CDT-CONTR-10 10 of all probes diamond and reflex
CDT-CONTR-20 20 of all probes diamond and reflex
CDT-CONTR-50 50 without diamond and reflex


Product screencast NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes

Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.


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