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ATEC-FMAu

Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

NANOSENSORS AdvancedTEC™ FMAu AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

The metallic coating is an approximately 70 nm thick double layer of chromium and gold on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode or where it is necessary to conduct high currents.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 35 30 - 40
Length /µm 240 230 - 250
Force Constant /(N/m) 2.8 0.7 - 9
Resonance Frequency /kHz 85 50 - 130

Order codes and shipping units:

Order Code Number of AFM probes per pack
ATEC-FMAu-10 10


 

Special handling information for NANOSENSORS™ AdvancedTEC probes

Due to their unique geometry the tips of the AdvancedTEC probes are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ AdvancedTEC probes are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

Product screencast NANOSENSORS™ AdvancedTEC™ AFM Probes

Please watch the new product screencast on NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes at http://youtu.be/qssFxoZ8ELY.
Please subscribe to the NANOSENSORS Youtube Channel.


For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG