AR10-NCH

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ AR10-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:: - length of the high aspect ratio; - portion of the tip > 1.5 µm; - typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well
as along cantilever axis); - half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8°; - guaranteed tip radius of curvature < 15 nm; - monolithic tip; - highly doped to dissipate static charge; - high mechanical Q-factor for high sensitivity

Cantilever data:

Technical Data	Nominal Value	Specified Range
Thickness /µm	4	3.0 - 5.0
Width /µm	30	22.5 - 37.5
Length /µm	125	115 - 135
Force Constant /(N/m)	42	10 - 130
Resonance Frequency /kHz	330	204 - 497

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Coating
AR10-NCH-10	10	of all probes	without
AR10-NCH-20	20	of all probes	without
AR10-NCH-50	50	without	without
AR10-NCH-W	> 370	of all probes	without

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com